Microlite orientation in obsidian flow measured by synchrotron X-ray diffraction
نویسندگان
چکیده
منابع مشابه
Deformation in Metallic Glasses Studied by Synchrotron X-Ray Diffraction
High mechanical strength is one of the superior properties of metallic glasses which render them promising as a structural material. However, understanding the process of mechanical deformation in strongly disordered matter, such as metallic glass, is exceedingly difficult because even an effort to describe the structure qualitatively is hampered by the absence of crystalline periodicity. In sp...
متن کاملEvaluation of the Orientation Distribution Function (odf) by Synchrotron X-ray Diffraction
At the High Energy X-ray laboratory (HEX-lab, Department of Engineering Science, University of Oxford, UK) we carry out studies of deformation and structure of engineering materials and components. Laboratory and synchrotron X-ray beams provide the principal means of analysis and measurement. A variety of other techniques are also in use. We present a range of applications and case studies in h...
متن کاملClarithromycin form I determined by synchrotron X-ray powder diffraction.
The structure of the metastable form I polymorph of the macrolide antibiotic clarithromycin, C(38)H(69)NO(13), was determined by a powder diffraction method using synchrotron radiation. The space group of form I is P2(1)2(1)2. The initial model was determined by a molecular replacement method using the structure of clarithromycin form 0 as a search model, and the final structure was obtained th...
متن کاملUltrafast structural changes measured by time-resolved X-ray diffraction
High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffractio...
متن کاملSynchrotron X-Ray Diffraction Topography of Semiconductor Heterostructures
7 VP T J üú û üŗ 4 J W VN»»S » û þĀŗ VS O ". . *Ć Ğ Ğ /,(Ą ðĞ Ć Ć ăāĂĚ ăÿüĚ Āú Ě þăüû Ě üŗ Preface " Jokainen tsäänssi on mahdollisuus! " – Matti Nykänen (Every chance is an opportunity) The work presented in this thesis was carried out in Optoelectronics Laboratory , of Electrical Engineering between 2003 and 2012. I want to express my sincere gratitude to Professor Harri Lipsanen for supervis...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Contributions to Mineralogy and Petrology
سال: 2018
ISSN: 0010-7999,1432-0967
DOI: 10.1007/s00410-018-1479-9